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	View All Offers Under Film Thickness Testers » Switch Major Category		Click an item's ID# below for its full specifications and source, or: Group Offers into sub-categories under Film Thickness Testers List all 12 product types under Film Thickness Testers

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Item ID  Photo Short Description Product Type / Details # Price Notes Location Make Model   $   110263 ADE   ADE   Episcan 1000  FT-IR Spectrometers in Spectrometers ADE Episcan 1000: ADE Episcan 1000 Film Thickness Measurement & Mapping Tool Measurement of Epi Films <25µ ON-LINE TECHNOLOGIES 2110 Spectrometer Head IRVINE OPTICAL Nanoloader II Dual Cassette Wafer Handler ADE ACS Controller Windows NT Operating System Price.............................................................................$75,000.00 As-Is Price....................................................................$40,000.00 1   F* Plano, Texas 225795 Bio-Rad   Bio-Rad   QS-1200  FT-IR Spectrometers in Spectrometers Bio-Rad QS-1200 FT-IR Spectrometer: BIORAD QS-1200 Automated FT-IR Spectrometer Non-Destructive Measurement of Epitaxial Silicon Films PIKE TECHNOLOGIES MAP300 Automatic Scanning Stage Manual Loading for up to 300mm Wafers 320 Test Points, 5mm Minimum Edge Exclusion & 3D Wafer Mapping FTS-175 Optical Bench Dynamically Tuned Beam Splitter NKBr Beam Splitter Dual Frequency IR Source Upgraded HeNe Laser System Control PC with Windows XP, 320G HD & 1G RAM Win-IR Pro (Rev. 2.51) Application Software QS-500 Epi (Rev. 1.31) Application Software Microsoft Access Database Application System Software, Applications Software & Site Preparation Manuals Included Refurbished & Fully Functional 1 110,029.48 Plano, Texas 144802 CR Technology   CR Technology   UF160/0  Xray Fluorescence Spectrometers in Spectrometers CR Technology XRay System UF160/0: XRAY Wafer Analyzer 1   Plano, TX 45435 Gaertner   Gaertner   L116B  Ellipsometers in Film Thickness Testers GAERTNER ELLIPSOMETER: Ellipsometer Upgraded in 2004 by Gaertner 1   F* Scotia, New York 39958 Gaertner   Gaertner   L2W16E.1550  Ellipsometers in Film Thickness Testers GAERTNER ELLIPSOMETER 150 MM: Ellipsometer 1   Scotia, New York 249592 J. A. Woollam   J. A. Woollam   M-2000  Ellipsometers in Film Thickness Testers J.A. Woollam M-2000 Spectroscopic Ellipsometer: J.A. Woollam M-2000 Spectroscopic Ellipsometer 1   Plano, Texas 249729 J.A. Woollam VB-200 Spectroscopic Ellipsometer  J.A. Woollam VB-200 Spectroscopic Ellipsometer  Ellipsometers in Film Thickness Testers J.A. Woollam VB-200 Spectroscopic Ellipsometer: J.A. Woollam VB-200 Spectroscopic Ellipsometer 1   Plano, Texas 250811 KLA-Tencor   KLA-Tencor   Aleris 8350  Film Thickness Testers - Other in Film Thickness Testers 1   Plano, Texas 104306 KLA-Tencor   KLA-Tencor   AlphaStep 300  Profilometers in Film Thickness Testers KLA-Tencor AlphaStep 300 Profilometer: Profilometer 1   Plano, TX 249589 KLA-Tencor   KLA-Tencor   ASET-F5x  Film Thickness Testers - Other in Film Thickness Testers KLA-Tencor ASET-F5x Thin Film Measurement System: KLA-TENCOR ASET-F5x Thin Film Measurement System Serial Number 0202802R Manufactured in June, 2002 Inspection Modes Include: Dual Beam Spectrometry Spectroscopic Ellipsometry Film Stress Analysis SUMMIT™ Application Software Version 3.21.16 FTML Version 3.46.06 Model 300DFF1P Wafer Loading Platform Dual Loadports for 300mm Wafers Three Axis Wafer Handling Robot GEM / SECS Communication 2   Albuquerque, New Mexico 250812 KLA-Tencor   KLA-Tencor   HRP-240  Film Thickness Testers - Other in Film Thickness Testers KLA-TENCOR HRP-240 High Resolution Profiler: KLA-TENCOR HRP-240 High Resolution Profiler 1   Plano, Texas 250822 KLA-Tencor   KLA-Tencor   SWE Kit  Ellipsometers in Film Thickness Testers KLA-TENCOR Spectra fx SWE Kit: KLA-TENCOR Spectra fx Single Wave Ellipsometer Kit 1   Plano, Texas 247843 KLA-Tencor   KLA-Tencor   UV-1050  Film Thickness Testers - Other in Film Thickness Testers KLA-Tencor UV-1050 Thin Film Measurement Tool: KLA-Tencor UV-1050 Thin Film Measurement Tool Cassette to Cassette Wafer Handling Wafer sizes: 100mm, 150mm & 200mm Broadband UV Optics Dual Beam Spectrophotometry Applications: Polysilicon, UV Reflectivity & Simultaneous Oxide and TiN Thickness for CMP System Control PC with Windows NT OS Summit Application Software GEM / SECS Communication System Installation at Destination Available 1 55,014.74 Austin, Texas 58429 McPherson   McPherson   2035  UV-Visible Spectrophotometers in Spectrophotometers MCPHERSON 2035 SPECTROMETER: UV-VIS-IR Spectrophotometer 1   F* Scotia, New York 248941 Nanometrics   Nanometrics   8300XSE  Ellipsometers in Film Thickness Testers Nanometrics 8300XSE Film Thickness Analyzer: Nanometrics 8300XSE Film Thickness Analyzer J.A. Woollam M-44 Spectroscopic Ellipsometer J.A. Woollam EC-270 Ellipsometer Controller J.A. Woollam LPS-420 Xenon Light Source Manual Loading of up to 300mm Wafers Yaskawa ERCR-NS01-B004 Motion Controller 1   Plano, Texas 42358 Nicolet   Nicolet   NEXUS 470  FT-IR Spectrometers in Spectrometers NICOLET (THERMO) FT-IR SPECTROMETER : FT-IR with Spectra-Tech Continuum Scope and TGA Interface Nicolet NEXUS 470 Nicolet acquired by Thermo Scientific   1   F* Scotia, New York 159451 Nicolet   Nicolet   Magna-IR 550  FT-IR Spectrometers in Spectrometers NICOLET Magna-IR 550: FT-IR Spectrometer 1   F* Plano, TX 172746 Plasmos   Plasmos   SD 2004  Ellipsometers in Film Thickness Testers Plasmos SD-2004 Multi-Wavelength Ellipsometer: Plasmos SD-2004 Multi-Wavelength Ellipsometer 1   Plano, TX 179535 Plasmos   Plasmos   SD2000  Ellipsometers in Film Thickness Testers 1   Plano, TX 103332 Rigaku   Rigaku   TXRF 300S  Xray Fluorescence Spectrometers in Spectrometers RIGAKU X-RAY FLUORESENCE SPECTROMETER: X-Ray Fluoresence Spectrometer Model: TXRF 300S 1   F* Scotia, New York 58212 Rudolph Research   Rudolph Research   AUTO EL RE-350  Ellipsometers in Film Thickness Testers RUDOLPH RESEARCH ELLIPSOMETER 150MM: Ellipsometer 1   Scotia, New York 86164 Rudolph Technologies   Rudolph Technologies   AUTO EL  Ellipsometers in Film Thickness Testers RUDOLPH RESEARCH ELLIPSOMETER 150MM: Ellipsometer 1   F* Scotia, New York 50006 Sagax   Sagax   Isoscope 125  Ellipsometers in Film Thickness Testers Sagax Isoscope 125: Ellipsometer 1   Plano, TX 241435 Sloan   Sloan   Dektak 3ST Auto 1  Profilometers in Film Thickness Testers Sloan Dektak3ST Surface Profile Measuring System: Sloan Dektak3ST Auto 1 Surface Profile Measuring System For Step Height & Surface Texture Measurement Self-Contained, Small Footprint Design Joystick Controlled Scanning Stage  8000 Data Points Specimen Stage: 6.5”(dia.); 6”X Axis X 3”Y Axis Travel; 360° θ Maximum Sample Thickness: 1.5” Measurement Display Range: 100Å to 1,310KÅ Vertical Resolution: 1Å/65KÅ; 10Å/655KÅ; 20Å/1310KÅ Stylus Force Range: 1mg to 40mg Scan Length Range: 50m to 50mm Scan Time Range: 3 to 50 Seconds Video Zoom Range: 60X to 420X (Motorized) 1   Plano, Texas 136700 Spectronic Unicam   Spectronic Unicam   4001/4  Spectrometers - Other in Spectrometers SPECTRONIC UNICAM SPECTROPHOTOMETER Genesys 20 4001/4: Spectrophotometer Genesys 20 Visible Spectrometer Spectronic Unicam 4001/4 1   Scotia, New York 140974 Thermo Electron   Thermo Electron   MicroXR GXR/C  Xray Fluorescence Spectrometers in Spectrometers THERMO ELECTRON MICROBEAM X-RAY FLUORESCENCE XRF SYSTEM: X-Ray Fluorescence System Thermo Scientific MicroXR GXR/C 2   Scotia, New York 98184 Veeco   Veeco   Dektak 3030 Auto II  Profilometers in Film Thickness Testers VEECO PROFILOMETER: Profilometer 1   F* Scotia, New York 109557 Veeco   Veeco   Dektak 3030  Profilometers in Film Thickness Testers VEECO PROFILOMETER: Profilometer 1   F* Scotia, New York

*   Vendor Role: Mfr is Manufacturer; Sup is Supplier/Distributor; OEM is Original Equipment Manufacturer

NOTE:
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Items from the following manufacturers are offered under Film Thickness Testers: ADE, Bio-Rad, CR Technology, Gaertner, J. A. Woollam, KLA-Tencor, McPherson, Nanometrics, Nicolet, Plasmos, Rigaku, Rudolph Research, Rudolph Technologies, Inc., Sagax, Sloan, Spectronic Unicam, Thermo Electron, Veeco Instruments